Freezing point temperature measuring method and temperature calibrating method in differential scanning calorimetry
AssigneeSII Nano Technology Inc.
InventorToshihiko Nakamura
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AssigneeSII Nano Technology Inc.
InventorToshihiko Nakamura
Estimating the term…
It is discovered that a range of showing a state in which a sample is at a constant temperature at a freezing temperature by a latent heat can be specified from a result of a differential scanning calorimetry in a cooling procedure and a method of acquiring the freezing point of the sample from data in the range is shown. For example, an output temperature of an intersection constituted by a tangential line extrapolated from a DSC curve, an output temperature curve, and a base line or an extension of a range brought into a liquid state including a supercooled state is read, and a method of analyzing the DSC curve, the output temperature curve constituting the freezing point of the sample by a temperature of the intersection is discovered and adopted.
A freezing point measuring method of acquiring a freezing point of a sample, comprising:
A method of measuring a freezing temperature of a sample exhibiting a supercool state, using a DSC, the method comprising:
A method of measuring a freezing temperature of a sample exhibiting a supercool state, using a DSC, the method comprising:
A method of measuring a freezing temperature of a sample exhibiting a supercool state, using a DSC, the method comprising:
A method of measuring a freezing temperature of a sample exhibiting a supercool state, using a DSC, the method comprising:
Dependencies are inferred from the claim text.