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US 7,532,547 B2Granted
Clock diagnostics
AssigneeThe Sapling Company, Inc.
InventorIian Shemesh
Life of this patent
Estimating the term…
Abstract
Disclosed is a clock for use in a master/slave clock system, including a system and method for semi-automatically performing diagnostic self-tests on the status and operability of a plurality of components of one or more secondary clocks. The invention addresses a multitude of diagnostic and problem detection issues, including “no fault found.”
Claims11
A clock comprising:
- a slave clock configured to be coupled to a master clock, and for receiving data from the master clock;
- and
- means within the slave clock for determining and displaying at the slave clock, and using at least one of the same indicators which display time at the slave clock, the amount of time that has passed since data was received by the slave clock from the master clock such that the at least one indicator at the slave clock is used to display time and the amount of time that has passed since data was received by the slave clock from the master clock.
A clock comprising:
- a slave clock configured to be coupled to a master clock, the slave clock being configured to receive data from the master clock, the slave clock having an indicator which provides an indication as to whether the slave clock has received any communication from the master clock in a particular time period, the indicator also being used in the display of time at the slave clock such that the indicator is used to display time and an indication as to whether the slave clock has received any communication from the master clock in the particular time period.
Dependencies are inferred from the claim text.