Method for eliminating punctual defects comprised in an electrochemical device
AssigneeSaint-Gobain Glass France
InventorFabien Beteille
Life of this patent
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Abstract
A method of eliminating, using a beam of laser radiation, defects lying within a laminate formed from at least a first substrate and from at least a second substrate. The laminate incorporates, between the first and second substrates, at least one smart active system. The method locates at least one defect lying within the active system and ablates the defect, by circumscribing the defect using a laser beam.
Claims12
A method of eliminating, using a laser beam of laser radiation, pinhole defects lying within a laminate formed from at least a first substrate and from at least a second substrate, the laminate incorporating, between the first and second substrates, at least one active system, the method comprising:
- locating at least one pinhole defect lying within the active system;
- and
- ablating the pinhole defect through at least one of the first or second substrates, by circumscribing the pinhole defect using the laser beam, the ablating the defect electrically isolating a peripheral region of the pinhole defect relative to the active system including the pinhole defect.
A glazing comprising:
- at least one of an electrochemical device or an electrically controllable system of glazing type with variable optical and/or energy properties, of a photovoltaic device or within an electroluminescent device, the electrochemical device being inserted between two electrodes positioned on either side, the electrochemical device including a pinhole defect ablated at its peripheral region, wherein a value of leakage current is reduced by a factor of 10 at a core of margination of the glazing.
Dependencies are inferred from the claim text.