Ion trap mass analyzer
AssigneeFudan University
InventorChuan-Fan Ding
Life of this patent
Estimating the term…
Abstract
An ion trap mass analyzer includes an elongated tunnel that has a wall, a longitudinal axis and an inner space. The wall includes a substrate and conductor trace patterns. There is also a variable electric potential means for providing electric potentials which is connected to the conductor trace patterns. The conductor trace patterns and the variable electric potential means provide a variable electric field within the inner space of the tunnel for transferring, storing, and analyzing ions.
Claims36
An ion trap mass analyzer comprising:
- an elongated tunnel having a wall, a longitudinal axis and an inner space, the wall comprising a substrate and conductor trace patterns;
- and
- variable electric potential means for providing electric potentials, the variable electric potential means being connected to the conductor trace patterns, the conductor trace patterns and the variable electric potential means providing a variable electric field within the inner space of the tunnel for transferring, storing, and analyzing ions.
An ion trap mass analyzer comprising:
- a plurality of ion trapping and analysis sections, each of the ion trapping and analysis sections comprising an elongated tunnel having a wall, a longitudinal axis and an inner space, the wall comprising a substrate and conductor trace patterns, each of the ion trapping and analysis sections being adjacent to and extending alongside respective ones of the ion trapping and analysis sections;
- and
- a variable electric potential means for providing electric potentials being connected to the conductor trace patterns of each of the ion trapping and analysis sections.
A method for tandem mass analysis using an ion trap mass analyzer having a plurality of ion trap and analysis sections, each of the ion trap and analysis sections comprising an elongated tunnel having a wall, a longitudinal axis and an inner space, the wall comprising a substrate and conductor trace patterns, each of the ion trap and analysis sections extending alongside respective adjacent ion trap and analysis sections, the method comprising the steps of:
- applying a high frequency voltage to the conductor trace patterns to create a trapping quadrupole electric field in each of the ion trap and analysis sections;
- providing ions in a first one of the ion trap and analysis sections;
- cooling the ions in the first one of the ion trap and analysis sections using a buffer gas;
- applying an excitation voltage to the conductor trace patterns in the first one of the ion trap and analysis sections to eject selected precursor ions by means of resonance ejection to a second one of the ion trap and analysis sections, the second one of the ion trap and analysis sections being adjacent the first one of the ion trap and analysis sections;
- fragmenting the precursor ions in the second one of the ion trap and analysis sections;
- and
- gathering and ejecting the fragmented ions from the second one of the ion trap and analysis sections.
A method for manufacturing an ion trap mass analyzer comprising the steps of:
- preparing multi-layer printed circuit boards having trace patterns;
- forming a polygonal tunnel using said printed circuit boards;
- and
- bonding the printed circuit boards with metal plates inside the polygonal tunnel;
- wherein the trace patterns on a tunnel side of the printed circuit boards are designed to create the required electric field within the polygonal tunnel for transferring, storing and analyzing ions when appropriate voltages are applied to the traces.
Dependencies are inferred from the claim text.