Testing system and testing method for a link control card
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorsKang Wu, Wei Zhang, Jun Huang
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AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorsKang Wu, Wei Zhang, Jun Huang
Estimating the term…
A system and method for testing a link control card (LCC) includes a host, a middle plane (MP), and an array having a plurality of testing devices. The host is connected to the LCC for transmitting signals, and the host is connected to the array for sending out commands and receiving results. The MP is connected between the LCC and the testing device array. Each of the testing devices includes a micro-controller unit (MCU), a connector connected to the MCU for receiving the signals, a hub connected to the connector for testing the signals, a voltage margin control unit connected to the MCU for controlling a voltage margin of the LCC, an address setting unit connected to the MCU, and a first interface connected to the MCU for outputting results.
A testing system for a link control card (LCC) of a storage device comprising:
A testing method for a link control card (LCC), comprising:
A method for testing linkage of an electronic device, comprising the steps of:
Dependencies are inferred from the claim text.