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US 7,480,587 B2Granted
Method for adaptive performance margining with thermal feedback
AssigneeIntel Corporation
InventorRamon C. Cancel
Life of this patent
Estimating the term…
Abstract
Numerous embodiments of a method to allow for adaptive performance margining of processing components on a carrier substrate are described. In one embodiment, the temperature of a processing component disposed on motherboard is measured and determined whether the temperature falls within a performance margining range. The processing speed of the component is then increased or maximized based on the performance margining range.
Claims18
A method, comprising:
- measuring a temperature of a processing component on a motherboard and a temperature of one or more zones of the motherboard;
- determining if the temperature of the processing component and the one or more zones of the motherboard is within a performance margining range of the processing component and the one or more zones of the motherboard;
- comparing the temperature of the processing component to a predetermined temperature limit for the processing component;
- comparing the temperature of the one or more zones of the motherboard to a predetermined temperature limit for a respective zone of the motherboard;
- comparing the temperature of a component of a zone of the motherboard to a predetermined temperature limit for the component of the zone of the motherboard;
- maximizing a processing speed of the processing component automatically based on the performance margining range;
- and
- maintaining the processing speed of the processing component at the current processing speed when the measured temperature of the processing component is at least above the predetermined temperature limit of the processing component, the temperature of the one or more zones of the motherboard is at least above the predetermined temperature limit of the respective zone of the motherboard, the temperature of the component of the zone of the motherboard is at least above the predetermined temperature limit of the component of the zone of the motherboard.
5 more elements
A method, comprising:
- monitoring a temperature of a CPU disposed on a motherboard and a temperature of one or more zones of the motherboard, the CPU having a temperature dependent clock rate;
- calculating a thermal margin of the CPU based on the temperature of the CPU and the temperature of the one or more zones of the motherboard to a predetermined limit;
- comparing the temperature of the one or more zones of the motherboard to a predetermined temperature limit for a respective zone of the motherboard;
- comparing the temperature of a component of a zone of the motherboard to a predetermined temperature limit for the component of the zone of the motherboard;
- increasing a clock rate of the CPU automatically based on the thermal margin by setting the clock rate to a level above a listed clock rate;
- and
- maintaining the clock rate of the CPU at the current clock rate when the measured temperature of the CPU is at least above the thermal margin of the CPU, the temperature of the one or more zones of the motherboard is at least above the predetermined temperature limit for the respective zone of the motherboard, the temperature of the component of the zone of the motherboard is at least above the predetermined temperature limit of the component of the zone of the motherboard.
4 more elements
An article of manufacture, comprising:
- a machine-accessible medium including data that, when accessed by a machine, cause the machine to perform operations comprising,
- measuring a temperature of a processing component on a motherboard and a temperature of one or more zones of the motherboard;
- determining if the temperature of the processing component and of one or more zones of the motherboard is within a performance margining range of the processing component and the motherboard;
- comparing the temperature of the processing component to a predetermined temperature limit for the processing component;
- comparing the temperature of the one or more zones of the motherboard to a predetermined temperature limit for a respective zone of the motherboard;
- comparing the temperature of a component of a zone of the motherboard to a predetermined temperature limit for the component of the zone of the motherboard;
- maximizing a processing speed of the processing component automatically based on the performance margining range;
- and
- maintaining the processing speed of the processing component at the current processing speed when the measured temperature of the processing component is at least above the predetermined temperature limit of the processing component, the temperature of the one or more zones of the motherboard is at least above the predetermined temperature limit of the respective zone of the motherboard, the temperature of the component of the zone of the motherboard is at least above the predetermined temperature limit of the component of the zone of the motherboard.
6 more elements
Dependencies are inferred from the claim text.