Semiconductor device generating a test voltage for a wafer burn-in test and method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsJin-Hyung Cho, Hi-Choon Lee
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Abstract
A semiconductor device for generating a test voltage for a wafer burn-in test and method thereof is disclosed. To generate the test voltage for a wafer burn-in test, a control signal may be generated in response to a supply voltage from an external wafer burn-in test device. A supplementary voltage may be generated in response to the control signal by using an internal voltage driving circuit. The test voltage may be generated by combining the supply voltage and the supplementary voltage.
Claims19
A method of generating a test voltage for a wafer burn-in test, comprising:
- generating a control signal in response to a supply voltage from an external wafer burn-in test device;
- generating a supplementary voltage in response to the control signal;
- and
- generating the test voltage by adding the supply voltage to the supplementary voltage.
A semiconductor device for generating a test voltage for a wafer burn-in test, comprising:
- a pad configured to receive a supply voltage from an external wafer burn-in test device;
- a control signal generator configured to generate a control signal in response to the supply voltage;
- an internal voltage driving circuit configured to generate a supplementary voltage based on the control signal;
- and
- an adder configured to generate the test voltage by adding the supplementary voltage to the supply voltage.
Dependencies are inferred from the claim text.