Maximum likelihood statistical method of operations for multi-bit semiconductor memory
AssigneeInternational Business Machines Corporation
InventorChung H. Lam
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorChung H. Lam
Estimating the term…
An operating procedure to provide a cost effective method to maximize the number of levels with respect to a characteristic parameter of a memory cell. The procedures utilize statistical analysis to determine the most likely binary value associated with the characteristic parameter value. In one embodiment, a receiving unit reads the values of the characteristic parameter for each memory cell in the memory cell collection containing a target memory cell. A generating unit generates a probability distribution function of the characteristic parameter for each of the possible binary values for the memory cell collection. The generating unit uses the probability distribution function to determine the probable value range for the shifted value of the characteristic parameter of the target memory cell. The value of the characteristic parameter for the target memory cell is converted into a binary value for which the probability is highest.
A method for operating a memory cell collection, the memory cell collection including a plurality of memory cells, each memory cell in the memory cell collection storing at least two possible binary values delimited by preset value ranges of a characteristic parameter, wherein the value ranges of the characteristic parameter shift over time, the method comprising:
A memory controller for operating a memory cell collection, the memory cell collection including a plurality of memory cells, each memory cell in the memory cell collection storing at least one possible binary value delimited by value ranges of a characteristic parameter, the method comprising:
A memory chip comprising:
A computer program product comprising a tangible computer readable medium embodying computer program code for operating a memory cell collection, the memory cell collection including a plurality of memory cells, each memory cell in the memory cell collection storing at least one possible binary values delimited by preset value ranges of a characteristic parameter, wherein the value ranges of the characteristic parameter shift over time, the computer program code comprising computer executable instructions configured for:
Dependencies are inferred from the claim text.