Back to results
US 7,480,046 B2Granted
Scanning microscope with evanescent wave illumination
AssigneeLeica Microsystems CMS GmbH
InventorsHeinrich Ulrich, Werner Knebel, Kyra Moellmann
Life of this patent
Estimating the term…
Abstract
A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.
Claims22
A scanning microscope comprising:
- a light source configured to evanescently illuminate a sample disposed on a slide;
- a point detector configured to receive detection light emanating from a scanning point of the sample;
- a beam deflection device disposed in an optical path of the detection light and configured to shift a position of the scanning point;
- and
- a color-selective segmented aperture disposed in an optical path of the illuminating light.
2 more elements
A scanning microscope comprising:
- a light source configured to evanescently illuminate a sample disposed on a slide;
- a point detector configured to receive detection light emanating from a scanning point of the sample;
- and
- a beam deflection device disposed in an optical path of the detection light and configured to shift a position of the scanning point;
- wherein the point detector includes at least one of a multi-band detector and a spectrometer.
2 more elements
A scanning microscope comprising:
- a light source configured to evanescently illuminate a sample disposed on a slide;
- a point detector configured to receive detection light emanating from a scanning point of the sample;
- and
- a beam deflection device disposed in an optical path of the detection light and configured to shift a position of the scanning point;
- wherein the point detector includes a detection pinhole.
2 more elements
A scanning microscope comprising:
- a light source configured to evanescently illuminate a sample disposed on a slide;
- a point detector configured to receive detection light emanating from a scanning point of the sample;
- a beam deflection device disposed in an optical path of the detection light and configured to shift a position of the scanning point;
- and
- a scanning unit configured to provide confocal scanning.
2 more elements
Dependencies are inferred from the claim text.