Device and method for analyzing a materials library

A method for analyzing a materials library, the method comprising:

• simultaneously testing a plurality of elements in the materials library using at least two methods in which electromagnetic radiation of different wavelength ranges is used, wherein at least two radiation sources for emitting electromagnetic radiation are used, a first of the at least two radiation sources emitting electromagnetic radiation in one of (a) an infrared wavelength range and (b) a Raman wavelength range and a second of the at least two radiation sources emitting electromagnetic radiation in one of (a) a UV wavelength range and (b) VIS wavelength range;
• performing a wavelength-dependent beam splitting behind the materials library;
• and
• deflecting the radiation in a direction of at least two flat sensors operating using high-sensitivity resolution, the at least two flat sensors being sensitive to different wavelength ranges;
• wherein a first wavelength range is in one of (a) the infrared wavelength range and (b) the Raman wavelength range and a second wavelength range is in one of (a) the UV wavelength range and (b) the VIS wavelength range.