A polishing pad for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies on a stationary table having a first dimension extending along a pad travel path and an illumination site from which a light beam can emanate from the table, the pad comprising:
- a planarizing medium having a planarizing surface configured to engage a substrate assembly and a backside to face towards the table, the planarizing medium being moveable over the table along the pad travel path to place a fresh portion of the planarizing surface at one side of a planarizing zone on the table and to remove a worn portion of the planarizing surface from an opposite side of the planarizing zone;
- an optically transmissive backing sheet having a top surface and an under surface, the top surface of the backing sheet adjacent the backside of the planarizing medium, the top surface having at least one ridge extending along a length of the planarizing medium in a direction generally parallel to the pad travel path, the ridge extending into a slot defined by the planarizing medium and defining an optical transmission path.