Loading patent…
AssigneeKoninklijke Philips Electronics N.V.
InventorsWiro Joep Niessen, Everine Brenda Van De Kraats, Theo Van Walsum, Eeico Lennart Rommes, Eugene Ivanov, Petrus Hubertus Maria America
Estimating the term…
The present invention relates to an X-ray examination apparatus and a corresponding method for acquiring X-ray image data of a region of interest by use of an imaging unit (1-3) comprising an X-ray source (2) for emitting X-ray radiation and an X-ray detector (3) for detecting X-ray radiation after penetration of said region of interest. In order to provide a quick and easy method which also reduces the X-ray dose to which a patient is exposed and which allows immediate acquisition of X-ray image data from a desired and possibly optimal position, it is proposed that the X-ray examination apparatus according to the invention comprises further: processing means (22) for determining a desired position of said imaging unit (1-3), at which X-ray image data shall be acquired, based on a predetermined image acquisition plan (P) and/or an actual position (D) of an instrument (11), control means (23) for determining position parameters of said imaging unit (1-3) for said desired position, and positioning means (30) for positioning said imaging unit (1-3) at said desired position by use of said position parameters.
X-ray examination apparatus for acquiring X-ray image data of a region of interest, comprising:
A method of X-ray examination for acquiring X-ray image data of a region of interest by use of an imaging unit comprising an X-ray source for emitting X-ray radiation and an X-ray detector for detecting X-ray radiation after penetration of said region of interest, comprising the steps of:
X-ray examination apparatus for acquiring X-ray image data of a region of interest, comprising:
Dependencies are inferred from the claim text.