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US 7,477,397 B2Granted
Self-calibrating optical reflectance probe system
AssigneeControl Development, Inc.
InventorTerrance R. Kinney
Life of this patent
Estimating the term…
Abstract
A self-calibrating optical reflectance probe system having an illuminant light source to illuminate a sample material, optical pickup means to collect reflected light from the sample material, and an articulated white reference reflection standard for illuminant reference to provide a system capable of accurately measuring optical reflectance and automated verification of proper operation. The probe system preferably employs an uncomplicated mount using a single pipe fitting and clamp.
Claims16
A self-calibrating optical reflectance probe system comprising:
- an illuminant light source for illuminating a sample material within a chamber;
- optical pickup means for collecting reflected light from the sample material;
- an articulated white reference reflection standard adapted to generate a white reference signal for calibration of the optical reflectance probe system when articulated to a position for reflecting light from the illuminant light source to the optical pickup means;
- a housing that encases and seals the illuminant light source, the optical pickup means, and the articulated white reference from contamination, the housing having a window through which illuminant light from the illuminant light source exits the housing and enters the chamber and through which the reflected light from the sample material within the chamber is reflected to the optical pickup means;
- and
- means for mounting the housing to the chamber.
3 more elements
A self-calibrating optical reflectance probe system comprising:
- an illuminant light source for illuminating a sample material within a chamber;
- optical pickup means for collecting reflected light from the sample material;
- an optical line source adapted for performing wavelength calibration and verification;
- a first window through which illuminant light passes from the illuminant light source, the first window being curved to so that a reflected portion of the illuminant light that is reflected by the first window is projected back to the illuminant light source and away from the optical pickup means;
- a white reference reflection standard adapted for use as an illuminant reference;
- means for articulating the white reference standard into and out of an optical path through the probe system, wherein a white reference signal is generated for calibration of the optical reflectance probe system when the white reference standard is articulated into the optical path so as to be illuminated by the illuminant light source and reflect light to the optical pickup means;
- a housing that encases and seals the illuminant light source, the optical pickup means, the optical line source, the first window, the white reference reflection standard, and the articulating means;
- and
- means for mounting the housing to and supporting the housing from the chamber, the mounting means having a second window through which illuminant light from the illuminant light source enters the chamber and through which the reflected light from the sample material within the chamber is reflected to the optical pickup means.
6 more elements
Dependencies are inferred from the claim text.