# US 7,466,538 B2 · Multilayer ceramic electronic device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 7,466,538 B2 - Document ID: US7466538B2 - Status: Granted - Kind: B2 - Application number: 11/931,667 - Filed: 2007-10-31 - Published: 2008-09-04 - Granted: 2008-12-16 - Earliest claimed: 2005-05-26 - Assignees: Murata Manufacturing Co., Ltd. - Inventors: Norihiko Sakamoto; Tomoro Abe - Web page: https://patentgrep.com/patent/US7466538B2 ## CPC - H01G 4/30: Stacked capacitors (H01G4/33 takes precedence) - H01G 4/008: Selection of materials - H01G 4/012: Form of non-self-supporting electrodes - Y10T 29/435: Solid dielectric type - H01G: CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B3/00; capacitors having potential barriers H10D1/62, H10K10/10) - Y10T: TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ## Abstract A highly reliable multilayer ceramic electronic device is obtained while preventing crack defects generated in a ceramic laminate by application of a heat shock in a mounting step or the like. The multilayer ceramic electronic device is constructed such that the average value of continuities of internal electrodes located in two regions (f) is lower by 5% to 20% inclusive than the average value of continuities of internal electrodes located in the central portion in a lamination direction. The two regions (f) are the regions from the topmost internal electrode and the bottommost internal electrode located in the lamination direction to the inside, respectively, within 10% of the distance (d) therebetween. Continuity is defined by (X−Y)/X in which X is the length of a cross section of an internal electrode in one direction and Y indicates the sum of gaps (g) formed by pores in the cross section of the internal electrode. ## Claims ### Claim 1 A multilayer ceramic electronic device comprising a laminate of a plurality of ceramic layers laminated to each other and a plurality of internal electrodes each of which is disposed between adjacent ceramic layers wherein, when continuity of each of the internal electrodes is defined by (X−Y)/X in which X indicates the length of a cross section of an internal electrode in one direction and Y indicates the sum of gaps formed by pores in the cross section of the internal electrode, the average value of continuities of the internal electrodes located in two regions (f) is lower than the average value of continuities of the other internal electrodes by 5% to 20% inclusive, the two regions (f) being the regions within 10% of the topmost internal electrode and the bottommost internal electrode of the distance therebetween. ### Claim 2 (depends on 1) The multilayer ceramic electronic device according to claim 1, wherein the internal electrodes comprise nickel. ### Claim 3 (depends on 2) The multilayer ceramic electronic device according to claim 2, wherein the thickness of each of the ceramic layers is 10 μm or less, and the number of laminated ceramic layers is 100 or more. ### Claim 4 (depends on 1) The multilayer ceramic electronic device according to claim 1, wherein the thickness of each of the ceramic layers is 10 μm or less, and the number of laminated ceramic layers is 100 or more. ### Claim 5 (depends on 1) The multilayer ceramic electronic device according to claim 1 which is a capacitor. ### Claim 6 In a method of forming a multilayer ceramic electronic device comprising laminating a plurality of ceramic layers with a plurality of electrodes pastes comprising metal each of which is disposed between adjacent ceramic layers, and sintering the laminate, controlling the continuity of the electrodes such that the average value of continuity of each of the electrodes located in two regions (f) is lower than the average value of continuities of the other electrodes by 5% to 20% inclusive, wherein continuity is defined by (X−Y)/X in which X indicates the length of a cross section of an electrode in one direction and Y indicates the sum of gaps formed by pores in the cross section of the electrode, and wherein the two regions (f) are the regions of the distance between the topmost and bottommost electrodes which are within 10% of the topmost electrode and the bottommost electrode. ### Claim 7 (depends on 6) The method according to claim 6, wherein the continuity is controlled by controlling the particle diameter of metal in the electrode. ### Claim 8 (depends on 7) The method according to claim 7, wherein the metal particle diameter in the electrodes disposed in regions f is greater than the metal particle diameter in the electrodes disposed in other regions. ### Claim 9 (depends on 6) The method according to claim 6, wherein the continuity is controlled by controlling the thickness of the electrodes. ### Claim 10 (depends on 9) The method according to claim 9, wherein the thickness of the electrodes disposed in regions f is less than the thickness of the electrodes disposed in other regions. ### Claim 11 (depends on 6) The method according to claim 6, wherein the continuity is controlled by controlling the solid content of the electrode pastes. ### Claim 12 (depends on 11) The method according to claim 11, wherein the solid content of the electrode paste for electrodes disposed in regions f is less than the solid content of electrode paste for electrodes disposed in other regions. ### Claim 13 (depends on 6) The method according to claim 6, wherein the thickness of each of the ceramic layers is 10 μm or less, and the number of laminated ceramic layers is 100 or more. ### Claim 14 (depends on 13) The method according to claim 13, wherein the ceramic layers and electrodes are disposed so as to form a capacitor. ### Claim 15 (depends on 6) The method according to claim 6, wherein the ceramic layers and electrodes are disposed so as to form a capacitor.