# US 7,466,153 B2 · Apparatuses for inspecting pogo pins of an electrical die sorting system and a method for performing the same > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 7,466,153 B2 - Document ID: US7466153B2 - Status: Granted - Kind: B2 - Application number: 11/490,120 - Filed: 2006-07-21 - Published: 2007-02-01 - Granted: 2008-12-16 - Earliest claimed: 2005-07-29 - Assignees: Samsung Electronics Co., Ltd. - Inventors: Jung-Nam Kim - Web page: https://patentgrep.com/patent/US7466153B2 ## CPC - G01R 1/06794: {Devices for sensing when probes are in contact, or in position to contact, with measured object} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract Apparatuses for inspecting pogo pins of an electrical die sorting (EDS) system are provided and a method for performing the same are provided. Apparatuses for inspecting pogo pins that delivers electrical signals between a tester and a probe when dies on a substrate are electrically tested are also provided. The apparatuses may include a lower plate, an upper plate and/or a sensing unit. The lower plate may be positioned under a pogo block including the pogo pins. The lower plate may include a conductive layer electrically connected to lower end portions of the pogo pins. The upper plate may be positioned over the pogo block. The upper plate may include conductive plugs corresponding to upper portions of the pogo pins. The sensing unit, for generating signals, may be coupled to an electrical contact between the conductive plugs and the pogo pins. ## Claims ### Claim 1 An apparatus for inspecting pogo pins, comprising: a lower plate positioned under a pogo block including the pogo pins, the lower plate including a conductive layer electricaliy connected to lower end portions of the pogo pins; an upper plate positioned over the pogo block, the upper plate including conductive plugs corresponding to upper portions of the pogo pins; a sensing unit generating signals, the sensing unit coupled with an electrical contact between the conductive plugs and the pogo pins; and a driving part for moving the upper plate toward the pogo block such that each of the conductive plugs contacts an upper portion of each of the pogo pins, wherein the apparatus transmits electrical signals between a tester and a probe when dies on a substrate are electrically tested. ### Claim 2 (depends on 1) The apparatus of claim 1, wherein the sensing unit includes: a power supply providing a voltage difference between the conductive layer and the conductive plugs; and a plurality of sensors connected to the power supply and the conductive plugs. ### Claim 3 (depends on 2) The apparatus of claim 2, wherein each sensor includes a light-emitting diode (LED). ### Claim 4 (depends on 2) The apparatus of claim 2, further comprising metal wirings formed on the upper plate, the metal wirings electrically connected to the plurality of sensors and the power supply. ### Claim 5 (depends on 4) The apparatus of claim 4, wherein the upper plate includes a first connection member for connecting the metal wiring to the power supply, and the lower plate includes a second connection member for connecting the conductive layer to the power supply. ### Claim 6 (depends on 1) The apparatus of claim 1, wherein the lower plate includes a screw hole, and the driving part includes a screw joint that penetrates the upper plate and the pogo block, further wherein the driving part is fixed into the screw hole of the lower plate by a screw coupling, the screw joint including a head portion and an axis integrally formed on the head portion as one body, the axis having screw threads on a circumferential surface thereof. ### Claim 7 (depends on 6) The apparatus of claim 6, wherein the head portion is prism-shaped having a plurality of faces. ### Claim 8 (depends on 6) The apparatus of claim 6, wherein the head portion is round and cylindrical shaped. ### Claim 9 (depends on 8) The apparatus of claim 8, wherein the head portion has a knurled outer surface. ### Claim 10 (depends on 6) The apparatus of claim 6, wherein the driving part includes a bearing between the upper plate and the axis of the screw joint. ### Claim 11 (depends on 1) The apparatus of claim 1, wherein the driving part includes a guiding member for guiding the upper plate in a desired direction such that each of the conductive plugs contacts a corresponding upper portion of the pogo pins, the guiding member extending from a bottom surface of the upper plate and penetrating the lower plate through a guiding hole in the lower plate. ### Claim 12 (depends on 1) The apparatus of claim 1, wherein the upper plate has a round disk shape. ### Claim 13 (depends on 1) The apparatus of claim 1, wherein the lower plate has a shape substantially identical to that of a probe card for testing dies on the substrate. ### Claim 14 (depends on 13) The apparatus of claim 13, wherein the lower plate is positioned on a probe card stage for supporting the probe card.