US 7,461,314 B2Granted

Test device

AssigneeAdvantest Corporation

InventorsNoriaki Chiba, Yasutaka Tsuruki

Life of this patent

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Abstract

A test device includes: the first reference clock generation unit for generating the first reference clock; the first test rate generation unit for generating the first test rate clock based on the first reference clock; the first driver unit for supplying the first test pattern to an electronic device based on the first test rate clock; the second reference clock generation unit for generating the second reference clock; the first phase synchronization unit for synchronizing the phase of the second reference clock with the phase of the first test rate clock; the second test rate generation unit for generating the second test rate clock based on the second reference clock having the synchronized phase; and the second driver unit for supplying the second test pattern to the electronic device based on the second test rate clock.

Claims12

Dependent claims

A test device for testing an electronic device, comprising:

a first reference clock generation unit operable to generate a first reference clock having a first frequency;
a first test rate generation unit operable to generate a first test rate clock indicating a period with which a first test pattern is supplied to said electronic device, based on said first reference clock;
a first driver unit operable to supply said first test pattern to said electronic device based on said first test rate clock;
a second reference clock generation unit operable to generate a second reference clock that is variable within a predetermined frequency range;
a first phase synchronization unit operable to synchronize a phase of said second reference clock with a phase of said first test rate clock;
a second test rate generation unit operable to generate a second test rate clock indicating a period with which a second test pattern is supplied to said electronic device, based on said second reference clock having said phase synchronized;
and
a second driver unit operable to supply said second test pattern to said electronic device based on said second test rate clock.

5 more elements

Dependencies are inferred from the claim text.

Facts

Application: 11/124,477Filed 6 May 2005 · continuation in part
Priority: JP 2003-1626036 Jun 2003
Published: US 2005/0210341 A122 Sep 2005
Granted: 2 Dec 2008
Term ends: Not estimatedThe source records don’t support an estimate.

Classification4 codes

G01R 31/31924
Stimuli generation or application of test patterns to the device under test [DUT]: voltage or current aspects, e.g. driver, receiver
G01R 31/31922
Stimuli generation or application of test patterns to the device under test [DUT]: timing generation or clock distribution
G01R 31/31928
Stimuli generation or application of test patterns to the device under test [DUT]: formatter
G01R
Measuring electric variables