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US 7,460,644 B2Granted
X-ray generating method and x-ray generating apparatus
AssigneesNoriyoshi Sakabe, Kiwako Sakabe
InventorNoriyoshi Sakabe
Life of this patent
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Abstract
An energy beam is irradiated onto a target from an energy beam source, thereby generating an X-ray with an irradiating area to be irradiated onto an object. Then, the X-ray is introduced into a spectrometer, thereby generating an X-ray with parallelism through the selection of wavelength and wavelength range.
Claims30
A method for generating an X-ray, comprising the steps of:
- irradiating an energy beam onto a target from an energy beam source, thereby generating an X-ray with an irradiating area to be irradiated onto an object;
- and
- introducing said X-ray into a spectrometer including a first reflective crystal plate and a second reflective crystal plate which are subsequently arranged at a relative angle twice as large as an incident angle of said X-ray onto said first reflective crystal plate, thereby generating an X-ray with parallelism through the selection of wavelength and wavelength range.
An apparatus for generating an X-ray, comprising:
- a target for generating an X-ray through the irradiation of an energy beam;
- an energy beam source for generating said energy beam to generate said X-ray so as to have an irradiating area to be irradiated onto an object;
- and
- a spectrometer for selecting wavelength and wavelength range of said X-ray through the introduction of said X-ray so as to generate an X-ray with parallelism from said X-ray,
- wherein said spectrometer includes a first reflective crystal plate and a second reflective crystal plate which are subsequently arranged at a relative angle twice as large as an incident angle of said X-ray onto said first reflective crystal plate.
2 more elements
A method for generating an X-ray, comprising the steps of:
- irradiating an energy beam onto a target from an energy beam source, thereby generating an X-ray with an irradiating area to be irradiated onto an object;
- and
- introducing said X-ray into a spectrometer including a first transmission crystal plate, a second reflective crystal plate and a third transmission crystal plate, which are subsequently arranged so that a reflection plane of said second crystal plate is perpendicular to reflection planes of said first crystal plate and third crystal plate, thereby generating an X-ray with parallelism through the selection of wavelength and wavelength range.
An apparatus for generating an X-ray, comprising:
- a target for generating an X-ray through the irradiation of an energy beam;
- an energy beam source for generating said energy beam to generate said X-ray so as to have an irradiating area to be irradiated onto an object;
- and
- a spectrometer for selecting wavelength and wavelength range of said X-ray through the introduction of said X-ray so as to generate an X-ray with parallelism from said X-ray, said spectrometer including a first transmission crystal plate, a second reflective crystal plate and a third transmission crystal plate which are subsequently arranged so that a reflection plane of said second crystal plate is perpendicular to reflection planes of said first crystal plate and said third crystal plate.
1 more element
Dependencies are inferred from the claim text.