Apparatus for measuring jitter and method of measuring jitter
AssigneeAdvantest Corporation
InventorsTakahiro Yamaguchi, Mani Soma, Masahiro Ishida
Life of this patent
Estimating the term…
Abstract
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, having a signal converting section for calculating a spectrum of the signal-under-measurement, a bandwidth calculating section for calculating frequency where a saturation rate of a value of the integrated spectrum of the signal-under-measurement becomes almost equal to a saturation rate set in advance in a band-to-be-measured set in advance as upper cutoff frequency of the band-to-be-measured to calculate the jitter and a jitter calculating section for measuring the jitter in the signal-under-measurement based on the spectaum in the band-to-be-measured of the signal-under-measurement.
Claims9
A jitter measuring apparatus for measuring jitter in a signal-under-measurement, comprising:
- a signal converting section for calculating a spectrum of said signal-under-measurement;
- a bandwidth calculating section for calculating band parameters where, for each of a plurality of inclinations of the spectrum, a value of an integrated spectrum of said signal-under-measurement over a determined band-to-be-measured becomes almost equal to an integrated value the spectrum over an entire bandwidth of the signal-to-be-measured;
- and
- a jitter calculating section for measuring said jitter in said signal-under-measurement based on said spectrum of each band-to-be-measured of the plurality of inclinations of said signal-under-measurement.
A jitter measuring method for measuring jitter in a signal-under-measurement, comprising:
- a signal converting step of calculating a spectrum of said signal-under-measurement;
- a bandwidth calculating step of calculating where, for each of a plurality of inclinations of the spectrum, a value of an integrated spectrum of said signal-under-measurement over a determined band-to-be-measured becomes almost equal to an integrated value of the spectrum over an entire bandwidth of the signal-to-be-measured;
- and
- a jitter calculating step of measuring said jitter in said signal-under-measurement based on said spectrum of each band-to-be-measured of the plurality of inclinations of said signal-under-measurement.
Dependencies are inferred from the claim text.