Flash memory device and erasing method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsDoo-Sub Lee, Jong-In Choi
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Abstract
A method of post-programming a flash memory device includes the steps of: post-programming memory cells of a selected word line in a predetermined unit; determining, after incrementing an address for selecting the next word line, whether the incremented address matches one of reference addresses; and varying the post-programming unit of the selected memory cells whenever the incremented address matches one of reference addresses.
Claims24
A method of post-programming a flash memory device, comprising the steps of:
- (a) post-programming memory cells of a selected word line from a plurality of word lines in a predetermined unit;
- (b) determining, after incrementing an address for selecting the next word line, whether the incremented address matches one of a plurality of reference addresses;
- and
- (c) varying the post-programming unit of the memory cells whenever the incremented address matches one of the plurality of reference addresses.
A method of post-programming a flash memory device, comprising the steps of:
- (a) selecting a word line from a plurality of word lines in response to an address;
- (b) post-programming memory cells of the selected word line in a predetermined post-programming unit;
- (c) determining, after incrementing the address, whether the incremented address matches one of a plurality of reference addresses;
- (d) varying the post-programming unit of the selected memory cells whenever the incremented address matches one of the plurality of reference addresses;
- and
- (e) repeating the steps (a) through (d) until all word lines are selected.
A flash memory device having a memory cell array with memory cells arranged in rows and columns, comprising:
- a row decoder selecting the rows in response to a row address;
- a column decoder selecting the columns in response to a column address;
- write drivers divided into a plurality of groups for driving the selected columns with a bit line voltage;
- a column address generator counting a number of post-programming operations and generating the column address and a count-up pulse signal;
- a row address generator configured to store a plurality of reference addresses, generating the row address in response to the count-up pulse signal;
- and
- a selection circuit generating selection signals to activate each of the write driver groups in response to a counted value of the count-up pulse signal,
- wherein the row address generator outputs flag information indicating a change of column selection unit whenever the row address matches one of the plurality of reference addresses, and
- wherein the selection circuit controls activation of the selection signals in accordance with the flag information so as to increase a number of the memory cells to be post-programmed in the selected columns.
Dependencies are inferred from the claim text.