Methods and systems for automatically characterizing non-linearities of a read-back signal of a recording system

A system of automatically characterizing non-linearities of a read-back signal of a recording system, said method comprising:

• a dibit extractor for obtaining a read-back signal having a main pulse and one or more echoes wherein said read-back signal comprises a baseline shift;
• an integrator for integrating an area of said read-back signal under said one or more echoes to obtain a corresponding one or more areas wherein said integrating subtracts any baseline shift area within said one or more echoes and wherein said one or more echoes is associated with one or more non-linearities;
• an integrator for integrating an area of said read-back signal under said main pulse to obtain another area and wherein said integrating subtracts any baseline shift area within said main pulse;
• and
• a parameter characterizer for computing parameters characterizing said one or more non-linearities based on said one or more areas and said another area under said main pulse.

A method of automatically characterizing non-linearities of a read-back signal of a recording system, said method comprising:

• using dibit extraction to obtain a read-back signal having a main pulse and a plurality of echoes and wherein said read-back signal comprises a baseline shift;
• integrating an area of said read-back signal under a first echo of interest to obtain a first area wherein said integrating subtracts any baseline shift area within said first echo and wherein said first echo is associated with a first non-linearity;
• integrating an area of said read-back signal under a second echo of interest to obtain a second area wherein said integrating subtracts any baseline shift area within said second echo and wherein said second echo is associated with a second non-linearity;
• integrating an area of said read-back signal under a third echo of interest to obtain a third area wherein said integrating subtracts any baseline shift area within said third echo and wherein said third echo is associated with a third non-linearity;
• integrating an area of said read-back signal under said main pulse to obtain an area and wherein said integrating subtracts any baseline shift area within said main pulse;
• and
• based on said first, second, and third areas and said area under said main pulse, computing parameters characterizing said first, second, and third non-linearities.

A method of automatically characterizing non-linearities of a read-back signal of a recording system, said method comprising:

• using dibit extraction to obtain a read-back signal having a main pulse and a plurality of echoes and wherein said read-back signal comprises a baseline shift;
• integrating an area of said read-back signal under a first echo to obtain a first area wherein said integrating subtracts any baseline shift area within said first echo and wherein said first echo is associated with a first non-linearity;
• integrating an area of said read-back signal under said main pulse to obtain a second area wherein said integrating subtracts any baseline shift area within said main pulse;
• and
• based on said first area and said second area, computing a first parameter characterizing said first non-linearity.

A system for automatically characterizing non-linearities of a read-back signal of a recording system, said method comprising:

• a dibit extractor for performing dibit extraction to obtain a read-back signal having a main pulse and a plurality of echoes and wherein said read-back signal comprises a baseline shift;
• an integrator for integrating an area of said read-back signal under a first echo to obtain a first area wherein said integrating subtracts any baseline shift area within said first echo and wherein said first echo is associated with a first non-linearity;
• an integrator for integrating an area of said read-back signal under said main pulse to obtain a second area wherein said integrating subtracts any baseline shift area within said main pulse;
• and
• a non-linearity characterizer for computing a first parameter characterizing said first non-linearity.