Pass-line and tilt insensitive sensor
AssigneeHoneywell International Inc.
InventorReijo Kuusela
Life of this patent
Estimating the term…
Abstract
The devices, systems and methods may continuously detect surface characteristics of a sample surface at a tilt. The exemplary system may have a conveying device for moving a sample surface, a light source for reflecting a beam of light off the sample surface, and a light detector with a light detection surface for continuous light detection. A lens may be used to reflect the beam of light from the sample surface and focus the beam of light on the light detection surface of the light detector. The area of the beam of light at the point of focus on the light detection surface may be unequal to the light detection surface. A reference analyzer may be used to determine the optical surface based on a comparison of the reflected light received with known reflected light values for known sample surfaces.
Claims20
A device for detecting one or more surface characteristics of a sample surface comprising:
- a light source for reflecting a beam of light off the sample surface;
- a light detector with a light detection surface;
- a lens for receiving the beam of light reflected from the sample surface and focusing the beam of light onto the light detection surface of the light detector, wherein an area of the focused beam of light at a point of focus on the light detection surface is larger than an area of the light detection surface, and wherein the focused beam of light covers the entire area of the light detection surface when the sample surface does and does not move or tilt;
- and
- an analyzer for determining the one or more surface characteristics of the sample surface based on a comparison of a measurement of the focused beam of light with known reflected light values for known sample surfaces.
A method for detecting one or more surface characteristics of a sample surface comprising the acts of:
- emitting a beam of light;
- reflecting the beam of light off the sample surface;
- focusing the beam of light reflected from the sample surface onto a light detection surface of a light detector, wherein an area of the focused beam of light at a point of focus on the light detection surface is larger than an area of the light detection surface, and wherein the focused beam of light covers the entire area of the light detection surface when the sample surface does and does not move or tilt;
- and
- determining the one or more surface characteristics of the sample surface based on a comparison of a measurement of the focused beam of light with known reflected light values for known sample surfaces.
A device for detecting one or more surface characteristics of a sample surface comprising:
- a light detector with a light detection surface;
- optics for receiving a beam of light reflected from the sample surface and focusing the beam of light on the light detection surface of the light detector, wherein an area of the focused beam of light at a point of focus on the light detection surface is larger than an area of the light detection surface, and wherein the focused beam of light covers the entire area of the light detection surface when the sample surface does and does not move or tilt;
- and
- an analyzer for determining the one or more surface characteristics of the sample surface based on a comparison of a measurement of the focused beam of light with known reflected light values for known sample surfaces.
Dependencies are inferred from the claim text.