Surface strain measuring device
AssigneeInsidix
InventorsJean-Claude Lecomte, Romain Fayolle
Life of this patent
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Abstract
The device enables strains of at least one surface (1) of a sample (2) to be measured versus temperature. Strains in a direction perpendicular to a predetermined plane, for example the plane of the surface (1), are measured by composite images. Strains in said plane are measured by image correlation. The measurements by image correlation and by composite images use a common visible light detection camera (3). The sample (2) is arranged in an enclosure (6) transparent at least locally to visible light (L). At least one infrared emitter (9) enables an infrared light to be created in a spectral band for a large part not detected by the camera (3).
Claims18
Device for measuring topographies and strains of at least one surface of a sample, comprising:
- first measuring means for measuring topographies and movements that are perpendicular to a plane defined by a surface of the sample, the first measuring means utilizing structured illumination,
- second measuring means for measuring strains that are in the plane defined by the surface of the sample, the second measuring means utilizing image correlation,
- the first measuring means and the second measuring means utilizing at least one common light detection camera,
- heating means and means for measuring the temperature of the sample,
- wherein
- the first measuring means comprise means for projecting composite images by illuminating the surface with a sequence of images, each image comprising a periodic pattern, the periodic patterns of the different images of the sequence of images respectively presenting pitches of different periodicities,
- the device comprises an enclosure transparent at least locally to visible light, wherein the sample is arranged, the heating means comprising at least one infrared emitter creating an infrared light not detected by the camera.
Dependencies are inferred from the claim text.