Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasket
AssigneeAdvanced Inquiry Systems, Inc.
InventorMorgan T. Johnson
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AssigneeAdvanced Inquiry Systems, Inc.
InventorMorgan T. Johnson
Estimating the term…
Concurrent electrical access to the pads of integrated circuits on a wafer is provided by an edge-extended wafer translator that carries signals from one or more pads on one or more integrated circuits to contact terminals on the inquiry-side of the edge-extended wafer translator, including portions of the inquiry-side that are superjacent the wafer when the wafer and the edge-extended wafer translator are in a removably attached state, and portions of the inquiry side that reside outside a region defined by the intersection of the wafer and the edge-extended wafer translator. In a further aspect of the present invention, access to the pads of integrated circuits on a wafer is additionally provided by contact terminals in a second inquiry area located on the wafer-side of the edge-extended wafer translator in a region thereof bounded by its outer circumference and the circumference of the attached wafer.
An apparatus for providing electrical access to one or more pads of one or more integrated circuits on a wafer, comprising:
Dependencies are inferred from the claim text.