Impedance measurement system with incorporated internal measurement drift compensation networks
OwnerDavid Jones, Dirk Kupershoek +1inventors
InventorsDavid Jones, Dirk Kupershoek, Peter Leigh-Jones
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Abstract
The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and minimized system size.
Claims28
An impedance measurement system for measuring the complex impedance of each well of a microtiter plate, the microtiter plate wells being formed in an array of rows and columns, the microtiter plate having a topside and an underside, the microtiter plate comprising sensors in the well bottoms and contact pads on the underside of the microtiter plate, the impedance measurement system comprising:
- (1) at least one daughter board comprising measurement and multiplexing circuitry, each daughter board being associated with a particular row of wells on the microtiter plate,
- the at least one daughter board lying in a plane perpendicular to the plane of the microtiter plate;
- (2) at least one top contact board,
- each top contact board assembly providing an interconnection means between a sensor associated with a particular well in a particular row and the daughter board associated with the row,
- the at least one top contact board lying in a plane which is parallel to the plane of the microtiter plate, above the at least one daughter board, and below the microtiter plate;
- (3) a motherboard comprising signal generation and signal processing circuitry, the mother board lying in a plane which is parallel to the plane of the microtiter plate and below the at least one daughter board;
- (4) a cell plate contact array providing a means for electrical connection between the at least one printed circuit board assembly and the microtiter plate contact pads;
- (5) a means for thermal control;
- and
- (6) a means for system impedance drift compensation comprising at least three resistor-capacitor networks.
An impedance measurement system for measuring the complex impedance of each well of a microtiter plate, the microtiter plate wells being formed in an array of rows and columns, the microtiter plate having a topside and an underside, the microtiter plate comprising contact pads on the underside of the microtiter plate, the impedance measurement system comprising:
- (1) at least one daughter board comprising measurement and multiplexing circuitry,
- each daughter board being associated with a particular row of wells on the microtiter plate,
- the at least one daughter board lying in a plane perpendicular to the plane of the microtiter plate;
- (2) at least one top contact board assembly,
- each top contact board assembly providing an interconnection means between a sensor associated with a particular well in a particular column and the daughter board associated with the column,
- the at least one top contact board lying in a plane which is parallel to the plane of the microtiter plate, above the at least one daughter board, and below the microtiter plate;
- (3) a motherboard comprising signal generation and signal processing circuitry,
- the mother board lying in a plane which is parallel to the plane of the microtiter plate and below the at least one daughter board;
- (4) a cell plate contact array providing a means for electrical connection between the at least one printed circuit board assembly and the microtiter plate contact pads;
- (5) a means for thermal control;
- and
- (6) a means for system impedance measurement drift compensation comprising at least three resistor-capacitor networks.
Dependencies are inferred from the claim text.