Electronic device testing apparatus
AssigneeAdvantest Corporation
InventorHiroto Nakamura
Life of this patent
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Abstract
An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested (20) against contact portions (110a) of a test head (110) while holding the electronic devices to be tested (20) on electronic device conveying media (11, 12, 13): wherein the electronic device testing apparatus comprises a test head (100) provided with a plurality of contact groups (111, 112, 113) made by sets of contact portions (100a), and a plurality of moving means capable of controlling independently from each other; and the respective moving means move the electronic device conveying media (11, 12, 13) loaded with the electronic devices to be tested (20) to corresponding contact groups (111, 112, 113) to conduct a test.
Claims10
An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested against sockets of a test head, wherein:
- the test head has a plurality of socket groups each of which is composed of a set of the sockets;
- the electronic device testing apparatus comprising;
- a plurality of moving devices each of which is capable of independently moving a strip format loaded with the electronic devices to the socket groups and pressing the electronic devices against the sockets while holding the electronic devices on the strip format,
- wherein the electronic devices are moved together with an entirety of the strip format.
An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested against sockets of a test head wherein:
- the test head has a plurality of socket groups each of which includes a set of the sockets;
- the electronic testing apparatus comprising;
- a plurality of moving devices each of which is capable of independently moving a strip format loaded with the electronic devices to the sockets and pressing the electronic devices against said the sockets while holding the electronic devices on the strip format;
- and
- a control device configured to finish tests with the shortest time on the remaining electronic devices on the strip format when a lot of the electronic devices finishes.
Dependencies are inferred from the claim text.