Terminator circuit, test apparatus, test head, and communication device
AssigneeAdvantest Corporation
InventorsToshiaki Awaji, Takashi Sekino
Life of this patent
Estimating the term…
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AssigneeAdvantest Corporation
InventorsToshiaki Awaji, Takashi Sekino
Estimating the term…
The present invention provides a terminator circuit including a potential variation detecting section that detects a variation in a potential at an end point to which an input signal is supplied, and a first current generating section that reduces an overshoot at the end point which is caused by the application of the input signal, by pulling a current from the end point, when the potential variation detecting section detects a rise in the potential at the end point. Here, the potential variation detecting section includes a comparison potential generating section that generates a comparison potential based on a reference potential, and a potential comparing section that compares the comparison potential which has risen in accordance with the rise in the potential at the end point, with the reference potential, and outputs a result of the comparison.
A terminator circuit comprising:
A test apparatus for testing a device under test, the test apparatus comprising:
A test head for supplying an input signal input by a device under test to a comparator that compares the input signal with a predetermined threshold voltage, the test head comprising:
A communication device comprising:
Dependencies are inferred from the claim text.