Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith
AssigneeJEOL Ltd.
InventorToshikatsu Kaneyama
Life of this patent
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Abstract
A method of analysis using an energy loss spectrometer and a transmission electron microscope equipped with the energy loss spectrometer. The spectrometer has a CCD camera for recording plural spectra as one photoelectric device image and a controller for batch reading in images from the camera, converting the positions of the pixels forming the images, and splitting each image into plural spectra. This permits improvement of the processing speed of the spectrometer.
Claims10
A method of analysis using an energy loss spectrometer adapted to obtain a spectrum by directing an electron beam at a sample such that the beam is transmitted through the sample and by passing the beam through an analyzer, said method of analysis comprising the step of:
- batch recording plural spectra in a single photoelectric device.
A method of analysis using an energy loss spectrometer adapted to obtain a spectrum by directing an electron beam at a sample such that the beam is transmitted through the sample and by passing the beam through an analyzer, said method of analysis comprising the steps of:
- obtaining an image of said spectrum;
- converting positions of pixels forming the image of the spectrum;
- and
- accumulating intensities of the image of the spectrum, which has been subjected to the conversion of the pixel positions, in a direction perpendicular to the direction of energy dispersion of the spectrum and graphing the accumulated intensities, thus obtaining an energy dispersive spectrum.
A transmission electron microscope equipped with an energy loss spectrometer adapted to obtain a spectrum by directing an electron beam at a sample such that the beam is transmitted through the sample and by passing the beam through an analyzer, said transmission electron microscope comprising:
- means for batch recording plural spectra in one photoelectric device.
A transmission electron microscope equipped with an energy loss spectrometer adapted to obtain a spectrum by directing an electron beam at a sample such that the beam is transmitted through the sample and by passing the beam through an analyzer, said transmission electron microscope comprising:
- means for obtaining an image of said spectrum;
- and
- image-processing means for (a) converting positions of pixels forming said obtained image of the spectrum, (b) accumulating intensities of the image of the spectrum, whose pixel positions have been converted, in a direction perpendicular to the direction of energy dispersion of the spectrum, and (c) graphing the accumulated intensities, thus obtaining an energy dispersive spectrum.
A transmission electron microscope equipped with an energy loss spectrometer, said transmission electron microscope comprising:
- an electron gun for emitting an electron beam;
- a condenser lens for focusing the beam from the gun onto a sample;
- first deflection means for deflecting the beam directed at the sample to vary the position of the beam on the sample;
- an analyzer for energy-dispersing the electron beam, which has been released from the sample, in a given direction to form a spectrum;
- photoelectric means for recording the spectrum formed by the analyzer;
- and
- second deflection means for deflecting the spectrum formed by the analyzer to record each spectrum, which is obtained at each different beam position on the sample, at a different position in the photoelectric means.
Dependencies are inferred from the claim text.