Mass spectrometer ionization source

An improved ionization source for a mass spectrometer, comprising,

• an ionization element with a surface that is chemically inert and has a finish resembling one selected from electropolished, chemical passivation polished, mechanical abrasive polished, cylindered, honed, and metal-to-metal polished finishes, the surface, comprising,
• a subsurface with an upper surface having a first finish, the finish selected from electropolished, chemical passivation polished, mechanical abrasive polished, cylindered, honed, and metal-to-metal polished finishes, and
• a top surface that is chemically inert, the top surface having an underside proximate to first finish, a top side opposed to first finish and a thickness of less than 0.001 inches.

A method of making an ionization element for a mass spectrometer, comprising,

• providing a first finish on the element using a process selected from electropolished, chemical passivation polished, mechanical abrasive polished, cylindered, honed, and metal-to-metal polished finishes;
• and
• applying a chemically inert surface on the first finish of the element in a manner that substantially replicates the first finish on to the side of the inert surface opposing the first finish.

A method of cleaning an ionization element of a mass spectrometer contaminated with analyte-generated contamination, comprising,

• providing an improved ionization element comprising a surface that is chemically inert and has a finish resembling one selected from electropolished, chemical passivation polished, mechanical abrasive polished, cylindered, honed, and metal-to-metal polished finishes, and
• applying solvent to remove analyte-generated contamination without the need for physical abrasion with abrasive materials.