Grinding apparatus and method
AssigneeStrasbaugh, a California corporation
InventorsThomas A. Walsh, Salman Moudrek Kassir
Life of this patent
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AssigneeStrasbaugh, a California corporation
InventorsThomas A. Walsh, Salman Moudrek Kassir
Estimating the term…
The present embodiments provide methods, systems and apparatuses for use in grinding work pieces, such as wafers. Some embodiments provide methods that position a grind spindle to contact a first grinding spindle to a face of a work piece, remove a portion of the face, and control the removing of the portion of the face according to a control algorithm. This control algorithm can comprise determining a force applied to the work piece during the removing of the portion of the face, adjusting a feed rate of the first grind spindle when the force applied to the work piece has a predefined relationship with a first threshold level; and dressing a portion of the first grinding portion when the force applied to the work piece has a predefined relationship with a second threshold level that is greater than the first threshold.
A method for grinding comprising:
A method of grinding a wafer, comprising:
A grinding apparatus comprising:
Dependencies are inferred from the claim text.