Vacuum apparatus including a particle monitoring unit, particle monitoring method, and program
AssigneeTokyo Electron Limited
InventorsTsuyoshi Moriya, Hiroyuki Nakayama
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AssigneeTokyo Electron Limited
InventorsTsuyoshi Moriya, Hiroyuki Nakayama
Estimating the term…
A semiconductor manufacturing apparatus includes a processing chamber for performing a manufacturing processing on a wafer. A gas supply line for introducing a purge gas is connected to an upper portion of the processing chamber, a valve being installed on the gas supply line. A rough pumping line with a valve a is connected to a lower portion of the processing chamber. Installed on the rough pumping line are a dry pump for exhausting a gas in the processing chamber and a particle monitoring unit for monitoring particles between the valve a and the dry pump. In the semiconductor manufacturing apparatus, after the valve is opened, the purge gas is supplied to apply physical vibration due to shock wave in the processing chamber 100 so that deposits are detached therefrom to be monitored as particles.
A vacuum apparatus comprising:
A particle monitoring method of a vacuum apparatus having a vessel for defining a predetermined space, comprising the steps of:
A computer-executable program, stored in a storage medium, for performing a particle monitoring method of a vacuum apparatus having a vessel for defining a predetermined space, comprising:
A computer-readable storage medium which stores therein a program, the program comprising:
Dependencies are inferred from the claim text.