Test apparatus, computer readable program for test apparatus, test pattern recording medium, and method for controlling test apparatus
AssigneeAdvantest Corporation
InventorNorio Kumaki
Life of this patent
Estimating the term…
Abstract
A test apparatus for testing a device under test includes a plurality of conversion processing units for converting split patterns recorded respectively on different split pattern recording sections in parallel, and a test pattern generating unit for providing a test pattern converted by the plurality of conversion processing units to the device under test, wherein a test pattern file used for testing the device under test includes a plurality of the split pattern recording sections where a plurality of the split patterns are recorded, and the test pattern for testing the device under test is split into the split patterns.
Claims7
A test apparatus for testing a device under test comprising:
- a plurality of conversion processing units for converting split patterns recorded respectively on different split pattern recording sections in parallel;
- and
- a test pattern generating unit for providing a test pattern converted by said plurality of conversion processing units to said device under test,
- wherein a test pattern file used for testing said device under test comprises a plurality of said split pattern recording sections where a plurality of said split patterns are recorded, and said test pattern for testing said device under test is split into said split patterns,
- the test apparatus further comprising a split pattern supplying unit for storing test pattern data comprised in said split pattern decompressed by said plurality of conversion processing unit on a location indicated by a test pattern address corresponding to said test pattern data in said test pattern generating unit,
- wherein each of said plurality of decompressed split patterns comprises test pattern data to be provided to said test pattern generating unit and said test pattern address indicating an address where said test pattern data is stored in said test pattern generating unit.
A computer readable medium containing a program instructing a test apparatus to test a device under test, the program comprising:
- a test pattern file used for testing said device under test comprising:
- a plurality of split pattern recording sections where a plurality of split patterns are recorded, wherein a test pattern for testing said device under test is split into said plurality of split patterns;
- and
- a storage location recording section where storage location of each of said plurality of split patterns is recorded;
- wherein said program instructs said test apparatus to perform as:
- a storage location selecting unit for selecting a plurality of storage locations of said split patterns respectively recorded on said different split pattern recording sections according to said storage location recording section;
- and
- a plurality of conversion processing units for convening in parallel said split pattern recorded on said storage location selected by said storage location selecting unit in said test pattern file,
- wherein each of the split patterns comprises test pattern data to be provided to a test pattern generating unit and a test pattern address indicating an address where the test pattern data is stored in the test pattern generating unit.
A method for controlling a test apparatus, which tests a device under test, a test pattern file used for testing said device under test comprising a plurality of split pattern recording sections where a plurality of split patterns are recorded, and a test pattern for testing said device under test being split into said split patterns, comprising:
- a converting step for convening split patterns recorded respectively on different split pattern recording sections into said test pattern in parallel;
- and
- a test pattern generating step for providing the test pattern to said device under test,
- wherein each of the split patterns comprises test pattern data to be provided to a test pattern generating unit and a test pattern address indicating an address where the test pattern data is stored in the test pattern generating unit.
Dependencies are inferred from the claim text.