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AssigneeInternational Business Machines Corporation
InventorsAnthony R. Bonaccio, Allen P. Haar, Joseph A. Iadanza, Douglas W. Stout, Ivan L. Wemple
Estimating the term…
A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage device within each respective chip. Then, for each of the remaining chips, a two-dimensional interpolation is performed to determine the process parameter value for the respective chip based on the measured value. The interpolated values are recorded along with the coordinates of the chip in an efuse control file. Such information is subsequently stored into an efuse module within the chip. On-chip digital control structures are used to adjust certain operational characteristics of a functional component within the chip based on the information stored in the efuse module.
A method for altering circuit characteristics to make them independent of processing parameters of a device within an integrated circuit, said method comprising:
An apparatus for altering resistances of on-chip resistors, said apparatus comprising:
Dependencies are inferred from the claim text.