Test device and setting method
AssigneeAdvantest Corporation
InventorsToshiaki Awaji, Takashi Sekino
Life of this patent
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AssigneeAdvantest Corporation
InventorsToshiaki Awaji, Takashi Sekino
Estimating the term…
A testing apparatus for testing a device under test is provided, wherein the testing apparatus includes: a comparator for receiving a signal output from the device under test and converting the signal into a logic signal by comparing the signal with a first reference voltage; a driver for amplifying a logic signal to be output to the device under test on the basis of a second reference voltage and outputting to the device under test; a comparator setting unit for determining the first reference voltage so as to compensate for a delay amount of a reception signal received from the device under test and setting the comparator to be the first reference voltage; and a driver setting unit for determining the second reference voltage on the basis of the reference voltage of the comparator and setting the driver to be the second reference voltage.
A testing apparatus for testing a device under test having therein a self-testing unit, comprising:
A testing apparatus, which includes an equalizer able to set an amplification amount for each frequency component and tests a device under test having therein a self-testing unit, comprising:
A setting method of a testing apparatus for testing a device under test having therein a self-testing unit,
A setting method of a testing apparatus, which includes an equalizer able to set an amplification amount for each frequency component and tests a device under test having therein a self-testing unit,
Dependencies are inferred from the claim text.