4Pi microscope
AssigneeLeica Microsystems CMS GmbH
InventorsVolker Leimbach, Reiner Rygiel
Life of this patent
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Abstract
A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.
Claims15
A 4Pi microscope comprising:
- an interferometer in which two objectives are positioned to oppose one another on different sides of an object plane, and having an optical element for coupling illuminating light into the interferometer and for coupling detected light out of the interferometer and for directing it into a detection beam path, a detected light portion being coupled out by the optical element and not directed into the detection beam path;
- a reflecting device configured to reflect illuminating light coupled out by the optical element back into the interferometer and to reflect the detected light portion coupled out by the optical element that is not directed into the detection beam path back into the interferometer;
- and
- a delay element configured to compensate for phase jumps, the delay element arranged between the optical element and the reflecting device.
Dependencies are inferred from the claim text.