Dimensional calibration standards
AssigneeKLA-Tencor Corporation
InventorsMarco Tortonese, Jerry Prochazka, Ellen Laird, Pat Brady, René M. Blanquies
Life of this patent
Estimating the term…
Loading patent…
AssigneeKLA-Tencor Corporation
InventorsMarco Tortonese, Jerry Prochazka, Ellen Laird, Pat Brady, René M. Blanquies
Estimating the term…
A calibration standard, for calibrating lateral or angular dimensional measurement systems, is provided. The standard may include a first substrate spaced from a second substrate. The standard may be cross-sectioned in a direction substantially perpendicular or substantially non-perpendicular to an upper surface of the first substrate. The cross-sectioned portion of the standard may form a viewing surface of the calibration standard. The standard may include at least one layer disposed between the first and second substrates. The layer, or a feature etched into the first or second substrate or a feature etched into the layer may have a traceably measured thickness or may be oriented at a traceably measured angle with respect to the viewing surface. A thickness or angle of the layer or other feature may be traceably measured using any technique for calibrating a measurement system with a standard reference material traceable to a national testing authority.
A calibration standard, comprising:
A method for forming a calibration standard, comprising the steps of:
Dependencies are inferred from the claim text.