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US 7,453,276 B2Granted
Probe for combined signals
AssigneeCascade Microtech, Inc.
InventorsLeonard Hayden, Scott Rumbaugh, Mike Andrews
Life of this patent
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Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
Claims10
A probe for simultaneously communicating a first signal and a second signal to a device, said probe comprising:
- (a) a first conductor connectable to a source of said first signal and having a suspended end portion;
- (b) a first contact tip nonconductively affixed to said suspended end portion of said first conductor, said first contact tip engageable with a first contact pad of said device;
- (c) a resistor conductively connecting said first contact tip to said first conductor;
- and
- (d) a second conductor connectable to a source of said second signal and arranged to provide a conductive path from said source of said second signal to said first contact pad while said first contact tip is in engagement with said first contact pad.
2 more elements
Dependencies are inferred from the claim text.