Method and apparatus for analyzing current in an integrated circuit under test
AssigneeXilinx, Inc.
InventorJames Guan
Life of this patent
Estimating the term…
Abstract
Method and apparatus for analyzing current in an integrated circuit under test is described. In one example, an image from detected photon emissions from the integrated circuit is generated. A first intensity of the photon emissions at a first region in the image indicative of a first current having a known magnitude is determined. A second intensity of the photon emissions at a second region in the image indicative of a second current is determined. A magnitude of the second current is estimated from the first intensity, the second intensity, and the known magnitude of the first current.
Claims20
A method of analyzing current in an integrated circuit under test, comprising:
- generating an image from detected photon emissions from the integrated circuit;
- determining a first intensity of the photon emissions at a first region in the image indicative of a first current having a known magnitude;
- determining a second intensity of the photon emissions at a second region in the image indicative of a second current;
- and
- estimating a magnitude of the second current from the first intensity, the second intensity, and the known magnitude of the first current.
Apparatus for analyzing current in an integrated circuit under test, comprising:
- means for generating an image from detected photon emissions from the integrated circuit;
- means for determining a first intensity of the photon emissions at a first region in the image indicative of a first current having a known magnitude;
- means for determining a second intensity of the photon emissions at a second region in the image indicative of a second current;
- and
- means for estimating a magnitude of the second current from the first intensity, the second intensity, and the known magnitude of the first current.
A system for testing an integrated circuit, comprising:
- a test unit configured to electrically bias the integrated circuit and capture photon emissions from the integrated circuit in response to the bias;
- and
- a computer, coupled to the test unit, configured to:
- generate an image from the photon emissions;
- determine a first intensity of the photon emissions at a first region in the image indicative of a first current having a known magnitude;
- determine a second intensity of the photon emissions at a second region in the image indicative of a second current;
- and
- estimate a magnitude of the second current from the first intensity, the second intensity, and the known magnitude of the first current.
Dependencies are inferred from the claim text.