Circuit and method for measuring delay of high speed signals
AssigneeLogicVision, Inc.
InventorsStephen K. Sunter, Aubin P. J. Roy
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AssigneeLogicVision, Inc.
InventorsStephen K. Sunter, Aubin P. J. Roy
Estimating the term…
A method and circuit for measuring a time interval between transitions of periodic signals at nodes of a circuit-under-test (CUT), the signals having a periodic clock frequency, the method includes periodically latching a digital value of a first periodic signal at edges of an undersampling clock, simultaneously periodically latching a digital value of a second periodic signal at edges of the undersampling clock, combining the latched digital values of the first and second periodic signals to produce a combined output whose duty cycle is proportional to the time interval between a median edge of latched digital values of the first periodic signal and a median edge of latched digital values of the second periodic signal; and counting the number of undersampling clock cycles in which the combined output is a predetermined logic value within a predetermined time interval whereat the number is proportional to a time interval between a transition of the first periodic signal and a transition of the second periodic signal.
A circuit for measuring a time interval between transitions of periodic signals at nodes of a circuit-under-test (CUT), the signal having a clock frequency fD, and the circuit comprising:
A method for measuring a time interval between transitions of periodic signals at nodes of a circuit-under-test (CUT), the signals having a periodic clock frequency, comprising:
Dependencies are inferred from the claim text.