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US 7,452,599 B2Granted
Fine silica particles having specific fractal structure parameter
AssigneeTokuyama Corporation
InventorsMasakazu Ohara, Minoru Kimura, Hiroo Aoki
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AssigneeTokuyama Corporation
InventorsMasakazu Ohara, Minoru Kimura, Hiroo Aoki
Estimating the term…
This invention provides flame-generated fine silica particles having an average particle size of 0.05 to 1 μm, wherein a fractal structure parameter α1 at length scales ranging from 50 nm to 150 nm and a fractal structure parameter α2 at length scales ranging from 150 nm to 353 nm satisfy the following formulas (1) and (2): −0.0068S+2.548≦α1≦−0.0068S+3.748 (1) −0.0011S+1.158≦α2≦−0.0011S+2.058 (2) wherein S is a BET specific surface area (m2/g) of the fine silica particles, in the measurement of small-angle X-ray scattering. When used as a filler for a semiconductor-encapsulation resin or when used as a filler for a polishing agent or for a coating layer for ink jet papers, the fine silica particles are available at high content without substantial enhancement of the viscosity. Besides, when used as a filler for the resin, the fine silica particles improve the strength of the molding compound. Furthermore, when used as a toner additive for electrophotography, the fine silica particles improve the free-flow property of the toner without removal from the toner surfaces.
Fine silica particles having an average particle size of 0.05 to 1 μm, wherein in a measurement of small-angle X-ray scattering, a fractal structure parameter α1 at length scales ranging from 50 nm to 150 nm and a fractal structure parameter α2 at length scales ranging from 150 nm to 353 nm satisfy the following formulas (1) and (2):
A filler for a semiconductor-encapsulation resin,2 comprising fine silica particles of having an average particle size of 0.05 to 1 μm, wherein in a measurement of small-angle X-ray scattering, a fractal structure parameter α1 at length scales ranging from 50 nm to 150 nm and a fractal structure parameter α2 at length scales ranging from 150 nm to 353 nm satisfy the following formulas (1) and (2):
A toner additive for electrophotography, comprising fine silica particles having an average particle size of 0.05 to 1 μm, wherein in a measurement of small-angle X-ray scattering, a fractal structure parameter α1 at length scales ranging from 50 nm to 150 nm and a fractal structure parameter α2 at length scales ranging from 150 nm to 353 nm satisfy the following formulas (1) and (2):
Dependencies are inferred from the claim text.