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US 7,451,665 B2Granted
Autoanalyzer and probe cleaning method
AssigneesKabushiki Kaisha Toshiba, Toshiba Medical Systems Corporation
InventorsTakehiko Oonuma, Hiroko Takayama
Life of this patent
Estimating the term…
Abstract
A specimen is sequentially sampled by a probe, and at least one of the number of times of cleaning and a cleaning time when cleaning the probe is changed based on at least one of the number of times of sampling of the specimen by the probe and a sampling amount of the specimen.
Claims9
An autoanalyzer comprising:
- a probe that samples a specimen;
- an analysis unit that analyzes the specimen sampled by the probe;
- a cleaning mechanism that cleans the probe;
- and
- a probe cleaning change section that changes at least one of the number of times of cleaning and a cleaning time of the probe by the cleaning mechanism based on at least one of the number of times of sampling of the specimen and a sampling amount of the specimen by the probe, wherein
- the probe cleaning change section has a preset number of times of sampling, and adds cleaning of the probe when the number of times of sampling exceeds the set number of times of sampling or when the total number of times of sampling including the next sampling exceeds the set number of times of sampling.
3 more elements
An autoanalyzer comprising:
- a probe that samples a specimen;
- an analysis unit that analyzes the specimen sampled by the probe;
- a cleaning mechanism that cleans the probe;
- and
- a probe cleaning change section that changes at least one of the number of times of cleaning and a cleaning time of the probe by the cleaning mechanism based on at least one of the number of times of sampling of the specimen and a sampling amount of the specimen by the probe, wherein
- the probe cleaning change section has a preset sampling integration amount, and adds cleaning of the probe when the sampling integration amount exceeds the set sampling integration amount or when the total sampling integration amount including a sampling amount in the next sampling exceeds the set sampling integration amount.
3 more elements
An autoanalyzer comprising:
- a probe that samples a specimen;
- an analysis unit that analyzes the specimen sampled by the probe;
- a cleaning mechanism that cleans the probe;
- and
- a probe cleaning change section that changes at least one of the number of times of cleaning and a cleaning time of the probe by the cleaning mechanism based on at least one of the number of times of sampling of the specimen and a sampling amount of the specimen by the probe, wherein
- the probe cleaning change section has a preset number of times of sampling and a preset sampling integration amount, and adds cleaning of the probe when one or both a case where the number of times of sampling exceeds the set number of times of sampling and a case where the total number of times of sampling including the next sampling exceeds the set number of times of sampling are achieved and when one or both a case where the sampling integration amount exceeds the set sampling integration amount and a case where the total sampling integration amount including a sampling amount in the next sampling exceeds the set sampling integration amount are achieved.
3 more elements
Dependencies are inferred from the claim text.