Test clocking scheme
AssigneeLSI Corporation
InventorsThai M. Nguyen, William Shen, Cam Lu
Life of this patent
Estimating the term…
Abstract
A test clocking scheme that separates the clock driving the functional logic and the memory from the clock driving the test logic and the memory. In other words, the test clocking scheme separates the memory functional clock from the memory test clock into two clock paths. The test clocking scheme provides for the ability to separately shut off either the memory functional clock source or the memory test clock source, provides that less power is required during production testing, and provides that simulation time is reduced during design verification because the functional logic is not clocked.
Claims15
A test clocking scheme comprising:
- a memory device;
- functional logic connected to the memory device;
- test logic connected to the memory device;
- a functional clock for driving the functional logic and the memory;
- and a test clock for driving the test logic and memory, wherein the test clock and the functional clock are separate such that the test logic is driveable by said test clock without said functional logic being driven by said test clock, wherein the scheme is configured such that a value of said test clock does not affect a value of said functional clock, wherein the scheme is configured such that the value of said functional clock does not affect the value of said test clock, wherein the scheme is configured such that the test clock and the functional clock are separate such that said functional logic is driveable by said functional clock without said test logic being driven by said functional clock, wherein the scheme is configured such that the functional clock and test clock can be shut off independently from each other such that the functional logic and memory are driven by said functional clock without said test logic having to be driven by said functional clock, and said test logic and memory are driven by said test clock without said functional logic having to be driven by said test clock.
Dependencies are inferred from the claim text.