Generation of memory test patterns for DLL calibration
AssigneeMicron Technology, Inc.
InventorsTravis E. Swanson, Roy E. Greeff
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsTravis E. Swanson, Roy E. Greeff
Estimating the term…
A system and method to generate memory test patterns for the calibration of a delay locked loop (DLL) using pseudo random bit sequences (PRBS) generated through a pair of liner feedback shift registers (LFSR). The generated patterns are implemented on the system data bus as test patterns that closely simulate run-time switching conditions on the system bus, so as to allow more accurate calibration of the DLL. Test data write/read operations may be performed while signals for the test patterns are present on various bit lines in the data bus so as to allow for accurate determination or adjustment of the value for the delay to be provided by the DLL to the strobe signals during memory data reading operations at run time. Memory chips may also be tested over an operating range of values using the generated test patterns.
A method of operating a processor connected to a memory through a bus having a plurality of bit lines, said method comprising:
A system comprising:
A system comprising:
A method of operating a processor connected to a memory through a bus having a plurality of bit lines, said method comprising:
Dependencies are inferred from the claim text.