Method and apparatus for facilitating debugging of an integrated circuit
AssigneeSun Microsystems, Inc.
InventorSi-En Chang
Life of this patent
Estimating the term…
Loading patent…
AssigneeSun Microsystems, Inc.
InventorSi-En Chang
Estimating the term…
One embodiment of the present invention provides a system that facilitates debugging an integrated circuit without probing signal lines within the integrated circuit. During operation the system updates a performance counter within the integrated circuit based on the occurrence of one or more performance events. Note that some integrated circuits already include a performance counter which is used to measure the performance of the integrated circuit. Next, the system triggers a debugging operation based on the content of the performance counter, thereby facilitating debugging of the integrated circuit without probing signal lines within the integrated circuit. By using the performance counter to trigger the debugging operation in addition to measuring performance, the present invention can substantially reduce the amount of additional circuitry required to facilitate debugging of the integrated circuit.
A method to facilitate debugging of an integrated circuit without probing signal lines within the integrated circuit, wherein the integrated circuit includes performance counters but does not include debug counters, the method comprising:
An apparatus to facilitate debugging of an integrated circuit without probing signal lines within the integrated circuit, wherein the integrated circuit includes performance counters but does not include debug counters, the apparatus comprising:
A computer system that includes a debugging-circuit to facilitate debugging of an integrated circuit without probing signal lines within the integrated circuit, wherein the integrated circuit includes performance counters but does not include debug counters, the debugging-circuit comprising:
Dependencies are inferred from the claim text.