Component reliability budgeting system
AssigneeIntel Corporation
InventorsSiva G. Narendra, James W. Tschanz, Vivek K. De, Stephen H. Tang
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Abstract
A system may include acquisition of a supply voltage information representing past supply voltages supplied to an electrical component, acquisition of a temperature information representing past temperatures of the electrical component, and control of a performance characteristic of the electrical component based on the supply voltage information and the temperature information. Some embodiments may further include determination of a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component, and change of the performance characteristic based on the reliability margin.
Claims24
A method comprising:
- acquiring supply voltage information representing past supply voltages supplied to an electrical component;
- acquiring temperature information representing past temperatures of the electrical component;
- changing a performance characteristic of the electrical component based on the supply voltage information and the temperature information;
- and
- determining a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component;
- wherein the performance characteristic is changed based on the reliability margin;
- and
- wherein determining the reliability margin comprises determining an extent to which an operational life of the electrical component has been depleted.
An apparatus comprising:
- a voltage sensor to determine a plurality of supply voltages supplied to an electrical component;
- a temperature sensor to determine a plurality of temperatures of the electrical component;
- and
- a control unit to change a performance characteristic of the electrical component based on the plurality of supply voltages and the plurality of temperatures;
- the control unit to determine an extent to which an operational life of the electrical component has been depleted.
A system comprising:
- a microprocessor comprising:
- a voltage sensor to determine a plurality of supply voltages supplied to the microprocessor;
- a temperature sensor to determine a plurality of temperatures of the microprocessor;
- and
- a control unit to change a performance characteristic of the microprocessor based on the plurality of supply voltages and the plurality of temperatures;
- the control unit to determine an extent to which an operational life of the microprocessor has been depleted;
- and
- a double data rate memory coupled to the microprocessor.
A medium storing program code, the program code comprising:
- code to acquire supply voltage information representing past supply voltages supplied to an electrical component;
- code to acquire temperature information representing past temperatures of the electrical component;
- code to change a performance characteristic of the electrical component based on the supply voltage information and the temperature information;
- and
- code to determine a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component,
- wherein the performance characteristic is changed based on the reliability margin;
- and
- wherein code to determine the reliability margin comprises code to determine an extent to which an operational life of the electrical component has been depleted.
Dependencies are inferred from the claim text.