Exempt source for an x-ray fluorescence device
AssigneeKeyMasters Technologies, Inc.
InventorsDonald K. Kenning, L. Stephen Price, Bruce J. Kaiser
Life of this patent
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Abstract
An x-ray fluorescence (XRF) device and a method for using the same to analyze a sample are described. The EMRXG source of the XRF device has a configuration that allows a greater amount of EMRXG to impinge on the sample being analyzed. The x-ray detector of the XRF device has a configuration that allows a greater amount of x-rays emitted by the sample to impinge on the detector. With such a configuration, the size and cost of the x-ray fluorescence device decreases. As well, fewer EMRXG are needed from the EMRXG source because of the greater efficiency and an exempt EMRXG source that is exempt from radioactivity licensing requirements can be used.
Claims25
An XRF device comprising:
- an internal housing containing a detector for high energy radiation;
- and
- a high energy radiation source contained within said same internal housing, said high energy radiation source and said detector proximate each other near a sensing end of said device, wherein an emitting end surface of said high energy radiation source defines a plane extending from and parallel to said emitting end surface, and a receiving end surface of said detector is parallel to said plane and is substantially positioned in said plane, and wherein said XRF device does not include a separate shield between said detector and said high energy radiation source.
A portable XRF device comprising:
- an internal housing containing a detector for high energy radiation;
- and
- a high energy radiation source contained within said same internal housing, said high energy radiation source comprising from about 1 μCi to about 100 μCi. of a radioactive material;
- said source and said detector are proximate each other near a sensing end of the device, wherein an emitting end surface of said high energy radiation source defines a plane extending from and parallel to said emitting end surface, and a receiving end surface of said detector is parallel to said plane and is substantially positioned in said plane, and wherein said XRF device does not include a separate shield between said detector and said high energy radiation source.
A method for analyzing a sample, said method comprising:
- providing a sample;
- providing an XRF device comprising a internal housing containing both a high energy radiation source and a high energy radiation detector, the high energy radiation source comprising a radioactive material, the high energy radiation source and the detector proximate each other near a sensing end of the device, wherein an emitting end surface of the high energy radiation source defines a plane extending from and parallel to the emitting end surface, and a receiving end surface of the detector is parallel to the plane and is substantially positioned in the plane, and wherein the XRF device does not include a separate shield between the detector and the high energy radiation source;
- and
- analyzing the sample using the XRF device.
A method for analyzing a sample, said method comprising:
- providing a sample;
- providing an XRF device comprising an internal housing containing both an EMRXG source and an x-ray detector, the EMRXG source comprising a radioactive material;
- an emitting end of the source and a receiving end of the detector proximate each other near a sensing end of the XRF device with the EMRXG source surrounding the detector, wherein an emitting end surface of the high source defines a plane extending from and parallel to the emitting end surface, and a receiving end surface of the detector is parallel to the plane and is substantially positioned in the plane, wherein the XRF device does not include a separate shield between the detector and the EMRXG source;
- and
- analyzing the sample using the XRF device, wherein the XRF device both irradiates the sample with EMRXG from the source and detects x-rays fluoresced by the sample.
Dependencies are inferred from the claim text.