Method for scattered radiation correction in the case of an X-ray CT, and X-ray CT for applying this method
AssigneeSiemens Aktiengesellschaft
InventorsHerbert Bruder, Karl Stierstorfer
Life of this patent
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AssigneeSiemens Aktiengesellschaft
InventorsHerbert Bruder, Karl Stierstorfer
Estimating the term…
It is proposed to estimate the scattered radiation on the basis of a sinogram, which is measured in any case. In at least one embodiment, a method includes determining the potential scattering site for each measuring beam from the object tangents in the sinogram and calculating the scattered intensity from the primary radiation striking the scattering site and the angle ratios of scattering beam, object tangent and measuring beam. Also proposed, in at least one embodiment, is an X-ray CT having at least bifocal detector systems and a control and computer unit for producing tomographic pictures, the control and arithmetic unit of which contains a program code that, upon being executed, carries out the method.
A method for scattered radiation correction for an X-ray computer tomograph including at least two X-ray sources, the scattered radiation being determined on the basis of a sinogram currently being measured from a scanned object, of the method comprising:
An X-ray CT comprising:
An X-ray computer tomograph, comprising:
Dependencies are inferred from the claim text.