Semiconductor device and the method of testing the same

A method of testing a semiconductor device having a function of driving a gate line of a liquid crystal display panel, the method comprising the steps of:

• changing and controlling, to a positive voltage output and a high-impedance state or to a negative voltage output and a high-impedance state, outputs of a plurality of output terminals for driving said gate line;
• and
• conducting a test of the plurality of output terminals of said semiconductor device, through a resistor network provided inside or outside said semiconductor device, by less channels of a semiconductor test equipment in number than the output terminals of said semiconductor device
• wherein the resistor network provided inside or outside said semiconductor device connects one end of a first resistor to each output terminal of the output circuits for driving the gate line of said liquid crystal display panel, connects the other end of said first resistor to a common connection point, and terminates said common connecting point on a second resistor to determine whether said semiconductor device is good or bad in accordance with a voltage value at said common connecting point.

A method of testing a semiconductor device having a function of driving a gate line of a liquid crystal display panel, the method comprising the steps of:

• changing and controlling, to a positive voltage output and a high-impedance state or to a negative voltage output and a high-impedance state, outputs of a plurality of output terminals for driving said gate line;
• and
• conducting a test of the plurality of output terminals of said semiconductor device, through a resistor network provided inside or outside said semiconductor
• device, by less channels of a semiconductor test equipment in number than the output terminals of said semiconductor device
• wherein the resistor network provided inside or outside said semiconductor device connects a first resistor between respective output terminals of the output circuits for driving the gate line of said liquid crystal display panel, and terminates, on a second resistor, one of both ends of the first resistor in which the one end of the first resistance connected between the respective output terminals is connected only to said output terminal to determine whether said semiconductor device is good or bad in accordance with a voltage value at a common connecting point of said first and second resistors.