Trimmable delay locked loop circuitry with improved initialization characteristics
AssigneeMicron Technology, Inc.
InventorsTyler Gomm, Eric Booth, Jongtae Kwak
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AssigneeMicron Technology, Inc.
InventorsTyler Gomm, Eric Booth, Jongtae Kwak
Estimating the term…
Disclosed herein is improved delay locked loop (DLL) initialization circuitry that alters the measurement used to initialize the variable delay line's delay (e.g., entry point or exit point) by using three clock phases: the DLL reference clock (input to the delay line), the reference clock as trimmed by a delay Tref, and the feedback clock as trimmed by a delay Tfb. By using these three phases at the appropriate time, the measurement is aware of the Tac trim for both positive (Tref) and negative (Tfb) trims. Specifically, measurement ‘start’ and ‘stop’ signals each pass through only one of delays Tref and Tfb, such that error in the measurement is a function of both Tref and Tfb. This improves the accuracy of the measurement such that additional shifting of the DLL is not necessary after initialization, and allows a wide trim range even for high clock frequencies.
A method for initializing a delay locked loop in an integrated circuit having an input clock and an output clock separated by a variable delay line, wherein the loop comprises a reference delay for ultimately receiving the input clock and a feedback delay for ultimately receiving the output clock, the method comprising:
A method for initializing a delay locked loop in an integrated circuit having an input clock and an output clock separated by a variable delay line, wherein the loop comprises trim circuitry for adjusting Tac positively or negatively, the method comprising:
Initialization circuitry for a delay locked loop in an integrated circuit, comprising:
Initialization circuitry for a delay locked loop in an integrated circuit, comprising:
Dependencies are inferred from the claim text.