Method for testing micro SD devices using each test circuits

A method for testing micro SD devices each having a plurality of electrical contacts, comprising:

• receiving said micro SD devices in industry standard device processing trays having a plurality of micro SD device receiving cells;
• forming a stack of said trays of micro SD devices;
• orienting said stack of said trays such that said contacts on each of said devices are in a predetermined orientation;
• providing a test hive comprising a plurality of test circuits corresponding in number to at least a predetermined portion of said cells and comprising a plurality of groups of test contacts, each group of said groups of test contacts being coupled to one of said test circuits and being oriented to engage said plurality of electrical contacts of a micro SD device disposed in a corresponding one of said cells;
• moving each said tray from said stack one at a time to a position proximate said test hive;
• causing relative movement of said tray proximate said test hive whereby said test hive engages said tray of micro SD devices and said test hive such that electrical connection is made simultaneously by each of said groups of test contacts with said electrical contacts of a micro SD device disposed in said corresponding one of said cells;
• and
• simultaneously, electrically testing at least a predetermined portion of said micro SD devices in each tray engaged by said hive without removing said micro SD devices from said tray.