Electronic device having an interface supported testing mode
AssigneeInapac Technology, Inc.
InventorAdrian E. Ong
Life of this patent
Estimating the term…
Abstract
A system is provided for testing a logic device and an integrated circuit disposed within a semiconductor device package. The logic device may be configured to operate in at least a normal mode and a test mode. A terminal external to the semiconductor device package may be electronically coupled to the logic device and the integrated circuit. The terminal may be configured to operate as a shared input for the logic device and the integrated circuit. A multiplexer circuit may be configured to convey a first signal from the terminal to the logic device in the test mode, to convey a second signal from the integrated circuit to the logic device in the normal mode, and to receive a third signal from the integrated circuit for causing a transition between the normal mode and the test mode.
Claims25
A system comprising:
- a logic device disposed within a semiconductor device package and configured to operate in at least a normal mode and a test mode;
- an integrated circuit disposed within the semiconductor device package;
- a terminal external to the semiconductor device package, electronically coupled to the logic device and the integrated circuit, and configured to operate as a shared input for the logic device and the integrated circuit;
- and
- a multiplexer circuit configured to convey a first signal from the terminal to the logic device in the test mode, to convey a second signal from the integrated circuit to the logic device in the normal mode, and to receive a third signal from the integrated circuit for causing a transition between the normal mode and the test mode.
A semiconductor device comprising:
- a first chip;
- a second chip configured to operate in a normal mode and a test mode;
- a semiconductor device package including the first chip and the second chip;
- one or more input terminals shared by the first chip and the second chip, at least part of each of the one or more input terminals being external to the semiconductor device package;
- a plurality of multiplexer circuits, each multiplexer circuit operable to pass a respective signal from the first chip when the second chip is in the normal operation mode, each multiplexer circuit operable to pass a respective signal from a respective member of the one or more input terminals when the first chip is in the test mode;
- and
- a test input control circuit configured to receive a signal from the first chip for causing the second chip to transition between the normal mode and the test mode.
An electronic device comprising:
- an external terminal configured for communicating electronic signals between the electronic device and a device external to the electronic device;
- a system integrated circuit;
- an auxiliary integrated circuit configured to be tested when the electronic device operates in a testing mode and to operate normally when the electronic device operates in a normal mode;
- and
- a multiplexer circuit configured to
- receive a control signal from the system integrated circuit for placing the multiplexer in the normal mode or the testing mode,
- convey electronic signals between the system integrated circuit and the auxiliary integrated circuit when the electronic device operates in the normal mode, and
- convey electronic signals between the external terminal and the auxiliary integrated circuit when the electronic device operates in the testing mode.
A method of operating an electronic device, the method comprising:
- operating the electronic device in a normal mode, the normal mode including communicating a first signal from a device external to the electronic device through an external terminal to a system integrated circuit disposed within the electronic device, and communicating a second signal from the system integrated circuit through a multiplexer to an auxiliary integrated circuit, the external terminal being shared by the system integrated circuit and the multiplexer;
- communicating a third signal from the system integrated circuit to the multiplexer, the third signal being configured to change the state of the multiplexer such that the electronic device is operable in a normal mode or a test mode;
- and
- operating the electronic device in the test mode, the test mode including communicating a fourth signal from a device external to the electronic device through the external terminal to the auxiliary integrated circuit via the multiplexer, the test mode being configured for testing the auxiliary integrated circuit.
Dependencies are inferred from the claim text.